an atomic force microscope afm 原子力显微镜技术
An image of a circuit with 17 memristors captured by an atomic force microscope.
原子力显微镜拍摄的17个忆阻器构成电路的图像。
Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
The Young's modulus of silicon nano-beam on <100> direction was measured by bending test method using an atomic force microscope(AFM).
阐述了基于原子力显微镜(AFM)的弯曲测试测量纳米梁杨氏模量的理论和方法。
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