Numerical simulations of micro scanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode.
采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Morphology of functional polysiloxane film and their orientation on fiber have been observed and studied by an atomic force probe microscope (AFM) and other instruments.
用原子力探针扫描电镜AFM等仪器对聚硅氧烷的膜形态及其排列方式作研究。
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