With the increase of sequential cells, adaptive scan has gradually been adopted.
随着时序单元的增多，自适应的扫描方案也逐渐被采用。
The scan solution was applied to MAC chip design and the adaptive scan was applied to EPAchip design, then we assessed the chip area and vectors loading time.
本文在MAC和EPA芯片的设计中分别应用了扫描设计和自适应扫描设计，然后对面积和测试矢量加载的时间进行了评估。
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