adaptive reseau scan 自适应网格扫描法
With the increase of sequential cells, adaptive scan has gradually been adopted.
随着时序单元的增多，自适应的扫描方案也逐渐被采用。
The scan solution was applied to MAC chip design and the adaptive scan was applied to EPAchip design, then we assessed the chip area and vectors loading time.
本文在MAC和EPA芯片的设计中分别应用了扫描设计和自适应扫描设计，然后对面积和测试矢量加载的时间进行了评估。
With ensuring the fault coverage, the adaptive scan can be ten-fold reduction in the number of test vectors, thus reducing test time and ultimately reduce the cost of chip.
自适应的扫描压缩方法在保证故障覆盖率的前提下，能够数十倍的减少测试矢量，进而减少测试所需时间，最终降低芯片成本。
应用推荐