The defect classification and the reason forming defect of VGA thin film transistor active matrix liquid crystal displays are analysed.
分析了VGA有源矩阵液晶显示器的缺陷分类、产生原因。
Patterned crystallization of amorphous silicon (a-Si) on substrates of glass is very important for the fabrication of thin film transistor used in active matrix liquid crystal displays.
以玻璃为基底的非晶硅图形式结晶，对于研制用于矩阵液晶显示的薄膜半导体具有重要意义。
The defect classification and the reason forming defect of VGA thin film transistor active matrix liquid crystal displays are analysed. Open tester, short tester and display tester are developed.
分析了VGA有源矩阵液晶显示器的缺陷分类、产生原因。研制出了有源矩阵液晶显示器的断路测试板、短路测试板以及全板显示测试板。
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