The shock characteristics of linear stacking packaging system were investigated under the action of half-sine acceleration pulse.
研究多层堆码包装系统在半正弦脉冲激励下的冲击特性。
The shock characteristics of a tangent packaging system with critical components are investigated under action of a half-sine acceleration pulse.
研究考虑易损件的正切型包装系统在半正弦脉冲激励下的冲击特性。
The secondary impact acceleration pulse which is produced by the drop-test can influence the testing parameters and cause fatigue and damage of components.
凸轮式跌落冲击台产生的次冲击能够影响试件的测试参数和性能，并能造成试件的疲劳损伤与失效。
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