The reliability of an interconnection film and insulating film formed on the semiconductor wafer are evaluated under an accelerated condition.

该半导体晶片上形成的一层互连膜与绝缘膜的可靠性可以在加速条件下加以评估。

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But Devin had a genetic condition called Hutchinson-Gilford progeria syndrome, also known as progeria, which causes premature, accelerated aging.

CNN: Advances in kids' early aging disease