为进一步降低测试功耗及测试应用时间，提出一种基于扫描链阻塞技术且针对非相容测试向量的压缩方法。

For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.

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我们改进了各向异性插值误差估计的判定方法，并给出非协调元的相容误差的各向异性误差估计的方法。

We have improved the method of anisotropic interpolation error estimations and presented a method to estimate the consistent errors of nonconforming elements.

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