... lumped process control system 集总过程控制系统 lumped system 集总系统 lumpy line 集中参数线 ...
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测试调度是系统芯片测试的一个重要方面，它用于确定把芯片上芯核的测试集分配给测试存取机制的方法，以使得总的测试时间最少。
Test scheduling determines an assignment of cores to test access mechanism such that the overall test application time of system on chip (SOC) is minimized.
文中指出，在给定其它参数时，系统的总效率仅是集热器工作温度的函数。
It is found that the total efficiency of the system is a function of operating temperature of the collector with given other parameters.
然后我们对该优化配置在采用集总放大的传输链路中进行了系统的描述，并通过仿真验证了该优化配置的有效性。
The proposed configuration for nonlinear cancellation is systematically depicted in transmission links with lumped amplification. Numerical simulations are performed to demonstrate effectiveness.
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