为了弥补目前采用的各种镀层厚度测量方法之不足，本文提出利用镀层元素一次X光激发的基底金属二次荧光进行膜厚测量的设想，并推导出相应的计算公式。
A suggestion was made to measure thin-film thicknesses using second X-ray fluorescence from substrate excited by primary X-ray of plating element, and corresponding equations were derived.
主要研究了电涡流传感器在多频率多参数下镀层厚度的测量方法。
This paper mainly studies the measuring method for the thickness of plating layer ofthe eddy-current sensor in the case of the multi-frequency and multi-parameters.
探讨了金属外壳镀镍涂层厚度的测试方法；论述了应用X射线荧光光谱法正确测量外壳镀层的方法。
Methods for measuring thickness of plated nickle coatings on metal cases are discussed, and proper procedures for measurement of coatings on metal cases using XRF spectrometry are dealt with.
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