提出了一种在内建自测试(BIST)中进行部分扫描的算法，此算法综合了电路的结构分析和可测性分析。
A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.
所有这些方法不仅要对原始数据库中改变的部分扫描，同时也要扫描对未改变的部分，工作量很大，要花费很多时间。
All proposed methods must examine not only the changed part but also the unchanged part in the original database, which is very large, and hence take much time.
在分析全扫描内建自测试(BIST)过高测试功耗原因的基础上，提出了一种选择部分寄存器成为扫描单元的部分扫描算法来实现低功耗BIST。
Based on the analysis of excessive power dissipation off ull-scan BIST, we present partial scan algorithm which selects a portion of registers for scan cells to implement low power BIST.
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