下一代的大规模集成电路的测试探头要求使用在铝电极上的低接触力的联接方法。
The contact method with low contact force on Al electrodes is required for test probing of LSI for the next generation.
This happens at the top of the cell where there is a probe attached and this moves the hair bundle to the right side.
细胞顶部的试探电极,会使毛发状的纤维束向右方移动,只要你吸住它。
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