采用X射线衍射和扫描电子显微镜测定了碳化硼粉的粒度和点阵数。
The grain size and lattice constant of Boron carbide was determined by method of X ray diffraction and scanning electron microscope (SEM).
本文报道了我国最近发现的硅硼镁铝矿晶胞参数、微双晶结构的电子衍射分析，晶体缺陷和矿物高分辨点阵象的透射电镜观测结果。
This paper has presented the results of TEM studies about the unit cell para-meters, micro-twinning structure, crystal defect and lattice fringe image of grandidierite discovered in China recently.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
应用推荐