薄膜材料特性 Characteristics of thin film materials
Domestic measuring technologies on thin film properties are almost off-line and foreign measuring devices mostly aim to measure individual property.
国内的薄膜特性检测技术大多为离线检测技术,国外的检测设备一般也仅检测个别量。
参考来源 - 半导体薄膜特性实时检测技术的研究·2,447,543篇论文数据，部分数据来源于NoteExpress
国内的薄膜特性检测技术大多为离线检测技术，国外的检测设备一般也仅检测个别量。
Domestic measuring technologies on thin film properties are almost off-line and foreign measuring devices mostly aim to measure individual property.
介绍了光波分复用器的工作原理，典型干涉膜型两波长光波分复用器器件结构原理及光学薄膜特性。
This article introduced the principle of WDM and the optical characters, proposed a novel structure of WDM.
利用光学和电子学结合的方法，建立了基于多光束光学传感器和光电检测电路的检测薄膜特性装置。
With a new combining method of optics and electronics, a device based on a multi-beam optical sensor and a photoelectric sensing circuit was setup.
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