荧光膜厚测试仪偏离，或测试方法错误。
Fluorescent film thickness tester deviation, or test method error.
此外，还对荧光膜的红外光谱进行了观察。
In addition, the IR spectra of the fluorescent films were also observed.
讨论了转光膜荧光强度与膜厚度的关系及光谱校正问题。
Dependence of intensity on thickness of LCFF and fluorescence spectra correction are investigated.
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