通过卷绕式连续真空镀膜膜厚测量的实例，证明效果良好。
Its practical application in measurement of films formed by winding and continuous vacuum film deposition shows that this method is effective.
光干涉膜厚测量技术的测量结果表明，外向流动区域高度随时间的变化与本文的分析相吻合。
The result of the height measurement of the outward region using optical interference technique exhibits a consistency with the analysis in this work.
文中还对多层膜的膜厚测量、X射线双晶衍射实验以及扫描电镜的表面象和剖面象进行了分析。
Film thickness measurements, bicrystal X-ray diffraction experiments and surface and cross-sectional micro-photographs taken by S. E. M. for epitaxial films are also discussed.
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