指出线宽误差对二元光学元件衍射效率影响较大。
It is pointed out that the linewidth error has very large effect of BOEs diffractive efficiency.
用谱线宽度方法定量检测了硅铋样品中含量为70%的铋， 相对误差小于7.15%，相对标准偏差为5.85%。
The quantitative determination of 70% bismuth in silicon-bismuth samples were completed by line width method. The relative error is less than 7.15%, the relative standard deviation is 5.85%.
根据仪器结构讨论了狭缝对谱线的影响，给出了狭缝宽度和谱线宽度的对应关系，并对仪器谱面上的相对测量误差进行了分析。
According to the structure of instrument, the influence of the slit width on spectral line is discussed, the relative measurement error of instrument is also analyzed.
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