剪切带两侧的纹理在形状、粗细、延伸方向和弯曲类型上均表现为明显的不一致。
The shape, thickness, stretch direction and bend type of the texture on both sides of the shear belt were observably different.
从纳米线阵列的TEM 图可以看到，纳米线长短大体一致，粗细均匀，表观形状与模板的柱形微孔相同。
TEM spectra of nanowires array show that the length of nanowires is uniform and that the shape of nanowires is the same with that of nanoholes.
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