新生儿窒息、早产以及神经系统感染性疾病等是造成婴儿脑损伤的最常见原因。

Neonatal asphyxia, premature birth and infectious diseases in nervous system are the most common causes, which resulted in newborn brain damage.

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目的：探讨脑电图在窒息新生儿超早期诊断脑损伤的价值。

OBJECTIVE: To explore the value of electroencephalogram in early diagnosis of brain injury in neonates with asphyxia.

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围产期窒息所致缺氧缺血性脑损伤(HIBD)是新生儿死亡和残疾的主要原因。

Hypoxia ischemic brain damage (HIBD), which resulted from neonatal asphyxia, is the main cause of death and disability in neonatal periods.

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