瞬态电流测试可以检测一些用电压测试和稳态电流测试不能检测的故障。
Dynamic current testing can detect some faults that cannot be detected by voltage based test method and quiescent current test method.
由于CMOS集成电路中的故障和制造缺陷是多种多样的，其中有些故障既不能被电压测试也不能被稳态电流测试方法检测出来。
Due to the diversity of the faults and manufacturing defects in CMOS IC, some of the faults can neither be defected by voltage test nor by IDDQ test.
本文首先分析了稳态电流测试方法和瞬态电流测试方法的原理、特点，并分别指出它们的不足，在此基础上研究了一种新型的测试方法——全速电流测试方法。
This paper presents a new test method-at-speed current testing based on analyzing the theories, characteristics and shortcomings of quiescent power supply current testing and dynamic current testing.
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