本文应用XPS（X射线光电子能谱仪）研究了真空烘烤对碘化铯光阴极化学状态的影响。
The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with X-ray photoelectron spectroscopy (XPS).
薄膜的成分及各元素的化学状态用光电子能谱(XPS)进行了分析。
Components and chemical states of the film were analyzed by XPS.
通过X射线能谱仪（EDS）和X射线光电子能谱（XPS）分别测定了复合膜在氧化和还原状态下的元素组成。
The elementary composition of PANI-SnP composite films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS).
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