如果元件或材料发生击穿，全部电压都会加到安培计的输入端，从而可能将其损坏。

If the component or material breaks down, all the voltage would be applied to the ammeter's input, possibly destroying it.

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使用分流型安培计(图2 - 49)时，输入电容对电流测量的影响与电压测量时类似。

The effects of input capacitance on current measurements using a shunt type ammeter (Figure 2-49) are similar to those for voltage measurements.

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由于安培计上的电压降可以忽略，所以所有的测试电压都出现在电阻R上。

Since the voltage drop across the ammeter is negligible, essentially all the test voltage appears across R.

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