本文提出了一种简单有效的、运用于模拟和混合信号电路的测试方法。
This paper presents a simple and efficient testing scheme for analog and mixed-signal circuits.
针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。
Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.
针对集成电路测试中模拟和混合电路的测试问题，提出了一种基于小波分析的电流测试实现混合信号电路故障诊断的方法。
How to test the analogue and mixed-signal circuits has become very critical to the IC testing, a novel fault diagnosis method based on current testing is proposed for mixed-signal circuits.
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