分析表明，从多个子列的氧化层电容漏电合格率的曲线可以求出氧化层完整性的表征因子E 值（每个缺陷包含的单元数）。
Analyses show that the characteristic factor for oxide integrity E , i. e. the number of elements per defect, can be calculated from oxide capacitor leak current yield curves.
介绍了一种新的化学反应方程式的配平方法，使用这种方法可以配平任何类型的氧化还原反应方程式，却不需知道反应式中氧化剂、还原剂氧化数的变化值及得失电子数。
According to conservation of mass, this article establishes a kind of mathematical model for the equation equilibrium of chemical reaction, and also gives its solution both by man and by computer.
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