计算中仔细考虑了源盒、真空壳、死层及P型芯等的影响。

Effects of source box, vacuum shell, dead layer and P-type wick in the calculation are considered in detail.

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随着薄膜厚度的减小，位错间距增大，“死层”厚度与薄膜总厚度之比增加。

With decreasing the film thickness, both the dislocation spacing and the ratio of the dead layer to film total thickness increase.

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结果探测器死层厚度和冷指尺寸调节前与调节后相比，理论计算与实测效率相对偏差的平均值由5.301%提高到3.937%。

Results It is proved that the average relative differences calculated and actual - measured before and after being adjusted have been increased from 5.301% to 3.937%.

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