这种设计使得一个样品在一个回路中分析，而下一个样品在第二个回路中分析。
This design allowed analysis on one circuit while the next sample was trapped on the second circuit.
从合成试验回路所获得的样品试验结果和以前从传统的背靠背试验回路获得试验结果是相同的。
The sample test results from this synthetic test circuit are comparable with that acquired previously from a conventional Back-to-Back direct test circuit.
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