Electronic speckle pattern interferometry (ESPI), which uses fringe analysis for nondestructive deformation field measurements, has become an important technique in the recent 20 years.
散斑干涉测量利用条纹分析实现变形场的无损测量。
参考来源 - 电子散斑载频调制与系统研究ESPI which uses fringe analysis for nondestrcture deformation field measurement has the characteristics of non-contact, whole field and high-precision measurement. And this technology has become an important technique in the recent twenty years.
电子散斑干涉测量利用条纹分析实现形变的无损测量,具有非接触、全场性、精度高的特点,近二十年来已成为变形场测量的重要方法。
参考来源 - 基于迈克尔逊干涉的傅里叶变换散斑形貌测量技术研究·2,447,543篇论文数据，部分数据来源于NoteExpress
本发明公开了一种数字干涉条纹分析方法及光学元件面形检测装置。
The invention discloses a method for analyzing digital interference fringe and a device for detecting optical component surface shape.
位相展开问题是所有基于条纹分析的光学测量技术都难以避免的问题。
The difficulty of phase unwrapping cannot be avoided in optical measurement based on fringe analysis.
本文提出一种无需滤波处理的调频条纹分析算法，该算法与傅里叶技术相比具有省时、便于进行快速、实时位相测量等优点。
A new algorithm of analysing FM (frequency modulation) interferogram is described. Compared with the Fourier method, it is time saving and suitable for real-time calculation.
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