最后，给出了一种整体设计流程来控制零点输出与提高成品率。
Finally, a full design flow was provided for controlling offset and improving yield.
对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。
Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.
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