钢铁显微分析用腐蚀液 oberhoffer solution
用扫描电子显微镜观察和测量腐蚀后硅样品的亚表面裂纹。
The depth of cracks on the silicon sample subsurface corroded was measured by a scanning electron microscope.
用光学显微镜观测和分析电火花线切割硅表面沿纵向分层择优腐蚀后的形貌；
The surface morphology after preferential corrosion along the vertical orientation was observed via an optical microscope.
单晶，通过化学腐蚀和金相显微镜研究了（101）晶面蚀坑的形貌、分布特征及其密度的大小。
The shape, distribution and density of etch pits on the (101) face was observed by metalloscope after chemical etching.
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