借助于不同的色散公式，运用单纯形法拟合测得的透过率光谱曲线，从而获得薄膜的光学常数和厚度。
Based on the dispersion equations, 'Downhill Simplex' method is utilized to measure the thickness and optical constants of thin film by fitting the curve of measured transmission spectrum.
作者研究了两类关于同轴锗探测器全能峰效率曲线的拟合公式。
In this paper, two equations which can be used to fit the efficiency curves of coaxial Germanium detectors are introduced.
本文分析了用曲线拟合的方法确定这五个常数的原理，导出了曲线拟合的相应公式，文中给出了算例。
In this paper, we have analyzed the principle calculating the five constants by virtue of the curve fitting, founded corresponding formula. We have presented one calculated example.
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