... removal 去除 scanning probe microscopy(SPM) 扫描显微探针 sealed container 密闭容器 ...
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... removal l 去除 scanning g probe microscopy(SPM) 扫描显微探针 sealed d container 密闭容器 ...
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扫描探针显微镜 Scanning Probe Microscopy ; SPM ; scanning probe microscope ; Scanning Probe
扫描探针显微术 scanning probe microscopy ; SPM ; STMAFM
扫描式探针显微镜 Scanning Probe Microscope ; SPM
扫描探针显微镜- Scanning Probe Microscopy
扫描探针显微 Scanning Probe Microscope
生物型扫描探针显微镜 Bioscope AFM
电化学扫描探针显微镜 ECSPM
多模式扫描探针显微镜 Pro Multimode Scanning Probe Microscope
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
采用三维时间域有限差分（FDTD）方法研究了扫描近场光学显微镜中光纤微探针的近场分布特性。
The near field distribution of uncoated and metal coated fiber optic probes were characterized by the method of three dimensional finite difference time domain (FDTD).
测量中，把扫描隧道显微镜的探针扫描线作为参考栅，把物质原子晶格栅结构作为试件栅，对这两组栅线干涉形成的云纹进行了纳米级变形测量。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
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