提出一种随机存取扫描测试方法，对扫描单元进行相容处理，以形成新的测试集合。

This paper proposes a random access scan and test approach, which deals with the compatible issue of scan unit to produce new test group.

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在分析全扫描内建自测试(BIST)过高测试功耗原因的基础上，提出了一种选择部分寄存器成为扫描单元的部分扫描算法来实现低功耗BIST。

Based on the analysis of excessive power dissipation off ull-scan BIST, we present partial scan algorithm which selects a portion of registers for scan cells to implement low power BIST.

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文章分析了1149.4和1149.1标准的测试访问端口，以及测试逻辑结构和测试协议的异同，提出了模拟边界 扫描单元ABM和 数字边界 扫描单元DBM的行为模型；

The test access port and test logic architecture and protocol of 1149.4 and 1149.1 standards are analyzed, and behavior models for ABM and DBM are put forward.

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