用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
本文对数控车削纯镍时刀具的沟槽磨损问题，应用扫描电镜、电子探针、俄歇能谱仪等进行了探讨。
Using electronic sweep mirror, electronic prober and energy spectrum meter to investigate the groove shape wear of a cutting tool, while numerical controlled turning the pure nickle.
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