电子显微镜扫描有问题项目的速度非常慢。
The electron microscope works by scanning the item inquestion extremely slowly.
针对共焦测量中单点扫描速度慢、机构复杂、光能利用率低的问题，介绍了一种利用结构光和共焦显微术相结合来实现多光束测量的新方法。
Focusing on the problem such as slow scanning speed, complex system design and low light efficiency, a simple method to obtaining optical sectioning in multiple-beam confocal measurement was proposed.
机械扫描式分光光度测色仪属传统方法，精度虽高但速度慢；
The mechanical spectral scanning instrument belongs to the traditional technique, whose precision and speed are relatively slow;
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