结合最优化方法，由样条函数方法求出的微分能谱能够分析固体电子的临界点参量。
By means of optimization, the electronic critical point parameters can be determined from the differential spectra obtained using spline function.
计算得到了不同能量的高能质子与硅反应产生的次级粒子种类、截面、能谱和双微分截面。
The variety, production cross section, energy spectrum and double differential cross section are calculated for the secondary particles produced by reactions of high energy protons in silicon.
用电子显微分析法和光电子能谱法术检测氧化膜中不同深处的成份。
The compositions of the oxidized membrane at different depths are examined by electronic microscopic analyses and optoelectronic energy spectra.
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