本文以实验为基础，提出在工具显微镜类仪器中，为了提高测量精度，应如何正确使用光（门东）。
On the basis of experiment, this paper proposes how diaphragms are used correctly with tooling microscope line equipment to improve measuring precision.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
用原子力显微镜作为测量工具，获取表面形貌数据。
And the surface texture data by atomic force microscope (AFM) are obtained.
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