That isolation logic and power on/off states are added to reduce power consumption in test mode, an optimization method of embedded SRAM for low power, is proposed in this thesis.
本文提出了一种嵌入式SRAM的低功耗优化方法:增加隔离逻辑及电源开启/关闭状态以降低测试模式下的功耗。
参考来源 - 嵌入式SRAM的优化设计方法与测试技术研究With the development of integrated circuit design goes into nanometer era, the progress of process brings new challenges to the design of embedded SRAM.
随着集成电路设计进入纳米时代,工艺的进步对嵌入式SRAM的设计提出了新的挑战。
参考来源 - 嵌入式CPU的纳米尺度SRAM设计研究·2,447,543篇论文数据,部分数据来源于NoteExpress
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