实验证明这种测量方法用于测量薄膜介质复介电常数简便、准确。

It's turned out that the method can be used to measure the complex permittivity of membrane materials conveniently with exact results.

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另外，当通过复介电常数的虚部引入光学增益后，我们发现缺陷模在增益介质中被放大，其阈值特性和缺陷折射率的密切相关。

We find that dispersive properties inside the micro-cavity lead to frequency shift of the defect modes. The defect modes can be amplified as optical gain is introduced into system.

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