文中介绍了一种基于概率方法的半导体发光器件可靠性预计模型。
This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light-emitting devices.
基于概率方法的核电厂结构的土-结构相互作用（简称SSI）分析尚缺乏充分的研究；
To date, it is not studied completely on nuclear powerplant structures using stochastic method and considering the SSI effect.
基于概率方法建立了高柔结构顺风向抗风设计中，考虑地震作用组合的总水平荷载的计算模型并进行了求解。
A model on the earthquake effect combination in wind resistant design of high-rise flexible structures is proposed in accordance with the probability method.
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