结果显示，杂质元素的含量偏高和沿晶界的偏析以及不均匀的钨晶粒是造成国产钨靶表面损伤的主要原因。
The results show that high content of impurity elements, segregation along grain boundaries and uneven grain size are main reasons for the surface damage of domestic tungsten targets.
加热速度仅影响到等轴晶粒的均匀性；
The heating rate only has influence on the uniformity of the crystal dimension.
从金相图可看出，低压烧结试样中的WC晶粒细小、均匀；
The metallographic figure showed that the WC grains were fine and uniform.
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