访存相关和访存冲突是向量计算机多端口存储器设计中所要解决的关键问题。
The access dependence and access conflict are the key problems to solve in the design of multiport memory of vector computers.
BIST控制器不仅可以执行传统的存储器测试算法，而且可以生成用于逻辑模块的测试向量。
The BIST controller can not only perform traditional memory test algorithms but also generates test patterns required for the logic part.
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