金属探头与半导体接触时的电阻可能相当高。
The resistance of the metal probe to semiconductor contact can be quite high.
已经设计出专门的探头来测量半导体晶圆片和半导体棒的电阻率。
Special probes have been designed for making resistivity measurements on semiconductor wafers and bars.
本文研制了一种用于高精度膜厚监测的真空微量天平探头：半导体致冷器件恒温探头。
In this paper, a probe of vacuum microbalance to monitor and measure for high accuracy of film thickness is introduced, thermostatic probe of the semiconductor refrigeration device.
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