该系统充分发挥了S3C44B0嵌入式微处理器高性能优势，经调试证明，能够可靠地实现对半导体分立器件的参数测试和分选的功能。
The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function.
介绍了半导体器件与电路的总剂量辐射效应及其测试技术。
The measurements of total dose effects of electronic devices and circuits are presented in this paper.
平板显示器中有源元件的参数测试与其他各类半导体器件的IC器件测试相同。
Characterizing the active elements in flat panel displays is similar to IC device testing on other types of semiconductors.
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