... semiconductor network 半导体器件网络 semiconductor parameter measurement 半导体参数测量 semiconductor parameter 半导体参数 ...
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介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。
The measurement results of complex dielectric constants of low loss and thin flake materials, conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.
本文论述了大功率列阵半导体激光器组侧泵浦YAG激光器的工作原理，在此基础上进行设计、制作并对激光器进行调试和性能参数测量。
The theory of side pumping Nd:YAG laser by high-power array-semiconductor laser cluster are discussed, on the basis of this theory, we design, make and justify the laser, and measure its data.
半导体激光器特性参数测量系统由激光器、PC机、LD检测仪和其他仪器组成。
The measurement system of LD was made up of PC and measurement instrument of LD and other measurement devices.
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