实验结果表明，该方法比现有的其它产生多分辨率图象锥的方法具有信息能量损失小的优点。
Comparing with the existing methods, the experiment results show that the method has the advantage of less information energy loss.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
本方法能够降低不同频率校正量误差的影响，尤其减少了高频成分的损失，对提高资料分辨率有较好的效果。
The method can reduce influence of errors existing in statics for different frequency, especially reduce the loss of high-frequency components, so that has a good result in improving data resolution.
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