软X线稀有气体电离室作为软X线波段绝对探测器,是通过测量光电离子流得出光谱辐射强度。
The technique of soft X-ray ion chamber includes the measurement of the ion current as a function of rare gas pressure in the ion chamber.
本文用爆裂噪声表征总剂量电离辐射(TID)对光电探测器组件的损伤情况。
The burst noise was used to characterize the degradation behavior of photodetector module radiated by the Total Ionizing Dose(TID) in this paper.
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