用X射线衍射仪、光学金相显微镜、透射电镜和扫描电镜研究了磁体的结构； 用磁强自动记录仪测量了磁体的退磁曲线。
The structure of the magnet was investigated by XRD, optical microscope, TEM and SEM, and its demagnetization curve was tested by magnetograph.
为了提高光学衍射法细圆柱体直径测量精度，用递归法建立了更精确的改进模型。
To improve measurement accuracy of thin cylinder's diameter by optical diffraction, an improved model is established with recursive method, which is more accurate.
根据光学衍射成像理论，建立了黑斑法测量光学系统杂光的杂光系数解析式。
Based on the diffraction imaging theory, we developed an analytical formula of Verling Glare Index of optical system by "balck spot" method.
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