The proposed BIST scheme relies on a pseudo-random testing phase and a deterministic phase.
这一自测试策略包含伪随机测试阶段和确定性测试阶段。
参考来源 - 面向数字系统的确定性自测试与延迟故障测试·2,447,543篇论文数据，部分数据来源于NoteExpress
这一自测试策略包含伪随机测试阶段和确定性测试阶段。
The proposed BIST scheme relies on a pseudo-random testing phase and a deterministic phase.
在伪随机测试方式下，随着测试的进行，测试矢量的效率大幅降低。
In pseudo random test mode, the efficiency of the vectors decreases sharply as the test progresses.
重新播种的测试方法是一种内建自测试方法，它可以用来提高伪随机测试矢量的故障覆盖率。
Reseeding is a built-in self-test (B. IST) testing method, which is used to improve fault coverage of pseudo-random testing.
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