The Stanford-Binet Intelligence Scale is an individually administered intelligence test that was revised from the original Binet-Simon Scale by Lewis M. Terman, a psychologist at Stanford University. The Stanford-Binet Intelligence Scale is now in its Fifth Edition. It is a cognitive ability and intelligence test that is used to diagnose developmental or intellectual deficiencies in young children. The test measures five weighted factors and consists of both verbal and nonverbal subtests. The five factors being tested are knowledge, quantitative reasoning, visual-spatial processing, working memory, and fluid reasoning.The development of the Stanford–Binet Intelligence Scales initiated the modern field of intelligence testing and was one of the first examples of an adaptive test. The test originated in France, then was revised in the United States. It was initially created by the French psychologist Alfred Binet, who---following the introduction of a law mandating universal education by the French government---undertook to develop a method of identifying "slow" children for their placement in special education programs (rather than removing them to asylums as "sick"). As Binet indicated, case studies might be more detailed and helpful, but the time required to test many people would be excessive. In 1916, at Stanford University, the psychologist Lewis Terman released a revised examination which became known as the "Stanford–Binet test".