通过理论计算，结果表明颜色的产生符合薄膜干涉原理。
By theoretical calculation, the creation of color is coincident to film interference principle.
从色度学的角度，对薄膜干涉光的颜色进行了定量分析。
In the view point of colorimetry, the quantitative analysis was carried out for the color of the light of film interference.
本文介绍了一种更为确切的讨论薄膜干涉的半波损失方法。
A more exact method of measuring loss of half-wave in thin-film interference is introduced.
由于实际薄膜表面的反射率差别很大，研究薄膜干涉方法应该有所区别。
Because reflectivity of practical thin film surface have more difference, its studied method must have differ.
红外薄膜干涉滤光片性能在低温下的变化是空间遥感系统中的一个关键性问题。
The deterioration in the performances of the infrared thin-film interference filters at low-temperature is crucial to the spaceborne remote sensing instruments.
利用玩具激光器对薄膜干涉和布朗运动实验进行改进，使实验现象更加明显、直观。
The film interference experiment and the Brownian motion experiment are improved by using toy laser, and the experimental phenomena are more obviously.
本文基于薄膜干涉滤光片角度调谐的基本原理，首次提出并实现了一种线性调谐光滤波器。
In this paper, a new linear tuning filter based on the angle-tuned thin-film interference filter is design for the first time.
利用光的干涉结果，分析了普通光源在薄膜干涉中对干涉条纹的影响和对薄膜厚度的限制。
Using light interference characteristics to analyze the effects of ordinary light thin film interference on the interference fringes and on the limitation of thin film thickness.
目前主要滤波技术有薄膜干涉滤波器、阵列波导光栅(awg)和光纤布拉格光栅(FBG)。
At the present time, the mainstream optical filter techniques including dielectric thin-film filter, array waveguide (AWG), Fabry-Perot (F-P) filter, fiber Bragg grating (FBG).
摘要：为了精确测量步进电机的脉冲当量和回程差，提出了一种基于薄膜干涉原理的激光微位移测量系统。
Abstract: in order to accurately measure the pulse equivalent and return difference of stepping motor, a laser micro-displacement measurement system is proposed based on thin film interference.
由此提出采用光栅衍射干涉测量薄膜折射率的方法和实验方案。
For these reasons we proposed methods and scheme for measuring film refractive index with grating diffraction interferometry.
薄膜光学所有的光学特性都是基于薄膜内光的干涉作用。
All the optical character of thin film is based on the interference of light inside.
普通物理实验中，牛顿环干涉实验只考虑在凸透镜与平面玻璃之间形成空气薄膜下的干涉现象。
In interference experiments with Newton's ring, considered only is the interference of the air film formed between the convex lens and the plain glass.
用激光照射牛顿半环来演示薄膜台阶的等厚干涉现象和测定薄膜厚度。
Newton's half ring is rayed by laser to demonstrate the equivalent thickness interference phenomenon of film step and measure film thickness.
本文讨论均匀薄膜的非定域干涉条纹的形成，并给出干涉条纹所满足的数学表达式。
In this paper, the interference patterns of non-localized interference by a plane parallel film is discussed.
在薄膜缺陷检测领域，成像技术，干涉测量，椭偏测量等一系列测量手段都得到了应用。
Imaging technique, interferometric method and ellipsometry are used in the defect detection of the thin film.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
根据弹性力学原理，基于应变不匹配，提出了一种可以预测薄膜残余应力分配的理论模型计算方法，并将计算结果与干涉仪测量值进行了对比。
Based on the principle of elasticity and strain misfit, a new calculation method of theoretical model to predict the residual stress distribution on optical thin films is put forward in this paper.
最后将错位相移器应用于集成电路硅片薄膜应力分布测试仪及错位电子散斑干涉仪之中。
This technic has been used in the instrument of IC wafer Stress Analyzer and Shear Electronic Speckle Pattern Interferometry (SESPI).
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
介绍了光波分复用器的工作原理，典型干涉膜型两波长光波分复用器器件结构原理及光学薄膜特性。
This article introduced the principle of WDM and the optical characters, proposed a novel structure of WDM.
本文搭建了一个用于精确测试光学薄膜位相特性的色散式白光频谱干涉仪。
A dispersive white-light spectral interferometer for precise measurements of the phase properties of multilayer thin film structures is built.
本文搭建了一个用于精确测试光学薄膜位相特性的色散式白光频谱干涉仪。
A dispersive white-light spectral interferometer for precise measurements of the phase properties of multilayer thin film structures is built.
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